我可以用功能接口作为源值来参数化测试吗？
我正在以这种方式测试具有多个字段的记录：

@Test
void instantiateWithInvalidName() {
    thenThrowsIAE(() -> Sample.withName(""));
    thenThrowsIAE(() -> Sample.withName(BLANK_STRING));
    thenThrowsNPE(() -> Sample.withName(null));
}

@Test
void instantiateWithInvalidAddress() {
    thenThrowsIAE(() -> Sample.withAddress(""));
    thenThrowsIAE(() -> Sample.withAddress(BLANK_STRING));
    thenThrowsNPE(() -> Sample.withAddress(null));
}    
// ...
    private static NullPointerException thenThrowsNPE(Executable exec) {
    return assertThrows(NullPointerException.class, exec);
}

private static IllegalArgumentException thenThrowsIAE(Executable exec) {
    return assertThrows(IllegalArgumentException.class, exec);
}

我想这样做：

@ParameterizedTest
@ValueSource(classes = { Sample::withName, Sample::withAddress }) 
void instantiateWithInvalidField() {
    thenThrowsIAE(() -> func.apply(""));
    thenThrowsIAE(() -> func.apply(BLANK_STRING));
    thenThrowsNPE(() -> func.apply(null));
}

我知道我可以通过参数：“”、空白字符串和null以另一种方式完成。但我想一场一场地做测试。我认为它更具可读性。